BibTeX record journals/mr/HsuLY01

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@article{DBLP:journals/mr/HsuLY01,
  author       = {C. T. Hsu and
                  M. M. Lau and
                  Y. T. Yeow},
  title        = {Analysis of the gate capacitance measurement technique and its application
                  for the evaluation of hot-carrier degradation in submicrometer MOSFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {41},
  number       = {2},
  pages        = {201--209},
  year         = {2001},
  url          = {https://doi.org/10.1016/S0026-2714(00)00222-5},
  doi          = {10.1016/S0026-2714(00)00222-5},
  timestamp    = {Sat, 22 Feb 2020 19:27:31 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HsuLY01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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