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BibTeX record journals/mr/HsuLY01
@article{DBLP:journals/mr/HsuLY01, author = {C. T. Hsu and M. M. Lau and Y. T. Yeow}, title = {Analysis of the gate capacitance measurement technique and its application for the evaluation of hot-carrier degradation in submicrometer MOSFETs}, journal = {Microelectron. Reliab.}, volume = {41}, number = {2}, pages = {201--209}, year = {2001}, url = {https://doi.org/10.1016/S0026-2714(00)00222-5}, doi = {10.1016/S0026-2714(00)00222-5}, timestamp = {Sat, 22 Feb 2020 19:27:31 +0100}, biburl = {https://dblp.org/rec/journals/mr/HsuLY01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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