BibTeX record journals/mr/HsiehWCSLCH09

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@article{DBLP:journals/mr/HsiehWCSLCH09,
  author       = {Zhen{-}Ying Hsieh and
                  Mu{-}Chun Wang and
                  Chih Chen and
                  Jia{-}Min Shieh and
                  Yu{-}Ting Lin and
                  Shuang{-}Yuan Chen and
                  Heng{-}Sheng Huang},
  title        = {Trend transformation of drain-current degradation under drain-avalanche
                  hot-carrier stress for {CLC} n-TFTs},
  journal      = {Microelectron. Reliab.},
  volume       = {49},
  number       = {8},
  pages        = {892--896},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.microrel.2009.05.011},
  doi          = {10.1016/J.MICROREL.2009.05.011},
  timestamp    = {Sun, 02 Oct 2022 15:44:01 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/HsiehWCSLCH09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}