BibTeX record journals/mr/HoussaAGGH07

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@article{DBLP:journals/mr/HoussaAGGH07,
  author       = {M. Houssa and
                  Marc Aoulaiche and
                  Stefan De Gendt and
                  Guido Groeseneken and
                  Marc M. Heyns},
  title        = {Negative bias temperature instabilities in HfSiO(N)-based MOSFETs:
                  Electrical characterization and modeling},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {6},
  pages        = {880--889},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2006.10.010},
  doi          = {10.1016/J.MICROREL.2006.10.010},
  timestamp    = {Sat, 22 Feb 2020 19:27:19 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HoussaAGGH07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}