<?xml version="1.0"?>
<dblp>
<article key="journals/mr/HotchkissAEHSSH01" mdate="2007-03-25">
<author>Greg Hotchkiss</author>
<author>Gonzalo Amador</author>
<author>Darvin Edwards</author>
<author>Paul Hundt</author>
<author>Les Stark</author>
<author>Roger Stierman</author>
<author>Gail Heinen</author>
<title>Wafer level packaging of a tape flip-chip chip scale packages.</title>
<pages>705-713</pages>
<year>2001</year>
<volume>41</volume>
<journal>Microelectronics Reliability</journal>
<number>5</number>
<ee>http://dx.doi.org/10.1016/S0026-2714(00)00261-4</ee>
<url>db/journals/mr/mr41.html#HotchkissAEHSSH01</url>
</article>
</dblp>
