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BibTeX record journals/mr/HirlerBALSLAH17
@article{DBLP:journals/mr/HirlerBALSLAH17, author = {Alexander Hirler and Josef Biba and Adnan Alsioufy and T. Lehndorff and Torsten Sulima and H. Lochner and U. Abelein and Walter Hansch}, title = {Evaluation of effective stress times and stress levels from mission profiles for semiconductor reliability}, journal = {Microelectron. Reliab.}, volume = {76-77}, pages = {38--41}, year = {2017}, url = {https://doi.org/10.1016/j.microrel.2017.06.022}, doi = {10.1016/J.MICROREL.2017.06.022}, timestamp = {Sun, 28 Jul 2024 14:40:30 +0200}, biburl = {https://dblp.org/rec/journals/mr/HirlerBALSLAH17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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