BibTeX record journals/mr/HirlerBALSLAH17

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@article{DBLP:journals/mr/HirlerBALSLAH17,
  author       = {Alexander Hirler and
                  Josef Biba and
                  Adnan Alsioufy and
                  T. Lehndorff and
                  Torsten Sulima and
                  H. Lochner and
                  U. Abelein and
                  Walter Hansch},
  title        = {Evaluation of effective stress times and stress levels from mission
                  profiles for semiconductor reliability},
  journal      = {Microelectron. Reliab.},
  volume       = {76-77},
  pages        = {38--41},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.06.022},
  doi          = {10.1016/J.MICROREL.2017.06.022},
  timestamp    = {Sun, 28 Jul 2024 14:40:30 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/HirlerBALSLAH17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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