@article{DBLP:journals/mr/HillmanCP03,
author = {C. Hillman and
B. Castillo and
Michael G. Pecht},
title = {Diffusion and absorption of corrosive gases in electronic
encapsulants},
journal = {Microelectronics Reliability},
volume = {43},
number = {4},
year = {2003},
pages = {635-643},
ee = {http://dx.doi.org/10.1016/S0026-2714(02)00315-3},
bibsource = {DBLP, http://dblp.uni-trier.de}
}