BibTeX record journals/mr/HenryKDB01a

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@article{DBLP:journals/mr/HenryKDB01a,
  author       = {Leo G. Henry and
                  Mark A. Kelly and
                  Tom Diep and
                  Jon Barth},
  title        = {The importance of standardizing {CDM} {ESD} test head parameters to
                  obtain data correlation},
  journal      = {Microelectron. Reliab.},
  volume       = {41},
  number       = {11},
  pages        = {1789--1800},
  year         = {2001},
  url          = {https://doi.org/10.1016/S0026-2714(01)00035-X},
  doi          = {10.1016/S0026-2714(01)00035-X},
  timestamp    = {Sat, 22 Feb 2020 19:27:32 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HenryKDB01a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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