BibTeX record journals/mr/HeT12

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@article{DBLP:journals/mr/HeT12,
  author       = {Feifei He and
                  Cher Ming Tan},
  title        = {Electromigration reliability of interconnections in {RF} low noise
                  amplifier circuit},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {2},
  pages        = {446--454},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2011.09.033},
  doi          = {10.1016/J.MICROREL.2011.09.033},
  timestamp    = {Sat, 22 Feb 2020 19:27:18 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HeT12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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