![](https://dblp.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
default search action
BibTeX record journals/mr/HayamaTOKMRMSC05
@article{DBLP:journals/mr/HayamaTOKMRMSC05, author = {Kiyoteru Hayama and Kenichiro Takakura and Hidenori Ohyama and S. Kuboyama and S. Matsuda and Joan Marc Raf{\'{\i}} and Abdelkarim Mercha and Eddy Simoen and Cor Claeys}, title = {Radiation source dependence of performance degradation in thin gate oxide fully-depleted {SOI} n-MOSFETs}, journal = {Microelectron. Reliab.}, volume = {45}, number = {9-11}, pages = {1376--1381}, year = {2005}, url = {https://doi.org/10.1016/j.microrel.2005.07.024}, doi = {10.1016/J.MICROREL.2005.07.024}, timestamp = {Sat, 22 Feb 2020 19:28:15 +0100}, biburl = {https://dblp.org/rec/journals/mr/HayamaTOKMRMSC05.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
![](https://dblp.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.