BibTeX record journals/mr/HattaSHZ10

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@article{DBLP:journals/mr/HattaSHZ10,
  author       = {Sharifah Wan Muhamad Hatta and
                  Norhayati Soin and
                  D. Abd Hadi and
                  Jianfu Zhang},
  title        = {{NBTI} degradation effect on advanced-process 45 nm high-k PMOSFETs
                  with geometric and process variations},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {9-11},
  pages        = {1283--1289},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2010.07.022},
  doi          = {10.1016/J.MICROREL.2010.07.022},
  timestamp    = {Sat, 22 Feb 2020 19:27:15 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HattaSHZ10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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