BibTeX record journals/mr/HanV04

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@article{DBLP:journals/mr/HanV04,
  author       = {L. Han and
                  Arkady Voloshin},
  title        = {Statistical analysis for test lands positioning and {PCB} deformation
                  during electrical testing},
  journal      = {Microelectron. Reliab.},
  volume       = {44},
  number       = {5},
  pages        = {853--859},
  year         = {2004},
  url          = {https://doi.org/10.1016/j.microrel.2003.12.002},
  doi          = {10.1016/J.MICROREL.2003.12.002},
  timestamp    = {Sat, 22 Feb 2020 19:28:17 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HanV04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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