BibTeX record journals/mr/HanCBF11

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@article{DBLP:journals/mr/HanCBF11,
  author       = {Jie Han and
                  Hao Chen and
                  Erin Boykin and
                  Jos{\'{e}} A. B. Fortes},
  title        = {Reliability evaluation of logic circuits using probabilistic gate
                  models},
  journal      = {Microelectron. Reliab.},
  volume       = {51},
  number       = {2},
  pages        = {468--476},
  year         = {2011},
  url          = {https://doi.org/10.1016/j.microrel.2010.07.154},
  doi          = {10.1016/J.MICROREL.2010.07.154},
  timestamp    = {Sat, 22 Feb 2020 19:28:04 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HanCBF11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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