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DBLP BibTeX Record 'journals/mr/HanCBF11'

@article{DBLP:journals/mr/HanCBF11,
  author    = {Jie Han and
               Hao Chen and
               Erin Boykin and
               Jos{\'e} A. B. Fortes},
  title     = {Reliability evaluation of logic circuits using probabilistic
               gate models},
  journal   = {Microelectronics Reliability},
  volume    = {51},
  number    = {2},
  year      = {2011},
  pages     = {468-476},
  ee        = {http://dx.doi.org/10.1016/j.microrel.2010.07.154},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}