BibTeX record journals/mr/HaendlerJGB01

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@article{DBLP:journals/mr/HaendlerJGB01,
  author       = {S{\'{e}}bastien Haendler and
                  Jalal Jomaah and
                  G{\'{e}}rard Ghibaudo and
                  Francis Balestra},
  title        = {Improved analysis of low frequency noise in dynamic threshold {MOS/SOI}
                  transistors},
  journal      = {Microelectron. Reliab.},
  volume       = {41},
  number       = {6},
  pages        = {855--860},
  year         = {2001},
  url          = {https://doi.org/10.1016/S0026-2714(01)00021-X},
  doi          = {10.1016/S0026-2714(01)00021-X},
  timestamp    = {Sat, 22 Feb 2020 19:28:12 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HaendlerJGB01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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