GuitardETBNPTPL05'

@article{DBLP:journals/mr/GuitardETBNPTPL05,
  author    = {N. Guitard and
               F. Essely and
               D. Tr{\'e}mouilles and
               M. Bafleur and
               Nicolas Nolhier and
               Philippe Perdu and
               Andr{\'e} Touboul and
               Vincent Pouget and
               Dean Lewis},
  title     = {Different Failure signatures of multiple TLP and HBM Stresses
               in an ESD robust protection structure},
  journal   = {Microelectronics Reliability},
  volume    = {45},
  number    = {9-11},
  year      = {2005},
  pages     = {1415-1420},
  ee        = {http://dx.doi.org/10.1016/j.microrel.2005.07.030},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}