BibTeX record journals/mr/GosWERJSG18

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@article{DBLP:journals/mr/GosWERJSG18,
  author       = {Wolfgang Goes and
                  Yannick Wimmer and
                  Al{-}Moatasem El{-}Sayed and
                  Gerhard Rzepa and
                  Markus Jech and
                  Alexander L. Shluger and
                  Tibor Grasser},
  title        = {Identification of oxide defects in semiconductor devices: {A} systematic
                  approach linking {DFT} to rate equations and experimental evidence},
  journal      = {Microelectron. Reliab.},
  volume       = {87},
  pages        = {286--320},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2017.12.021},
  doi          = {10.1016/J.MICROREL.2017.12.021},
  timestamp    = {Thu, 13 Jul 2023 08:31:49 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/GosWERJSG18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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