BibTeX record journals/mr/GopalanKEVZ02

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@article{DBLP:journals/mr/GopalanKEVZ02,
  author       = {Sudha Gopalan and
                  Benno H. Krabbenborg and
                  Jan{-}Hein Egbers and
                  Bart van Velzen and
                  Rene Zingg},
  title        = {Reliability of power transistors against application driven temperature
                  swings},
  journal      = {Microelectron. Reliab.},
  volume       = {42},
  number       = {9-11},
  pages        = {1623--1628},
  year         = {2002},
  url          = {https://doi.org/10.1016/S0026-2714(02)00201-9},
  doi          = {10.1016/S0026-2714(02)00201-9},
  timestamp    = {Sat, 22 Feb 2020 19:28:44 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/GopalanKEVZ02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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