BibTeX record journals/mr/GoguenheimPO07

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@article{DBLP:journals/mr/GoguenheimPO07,
  author       = {Didier Goguenheim and
                  D. Pic and
                  Jean{-}Luc Ogier},
  title        = {Oxide reliability below 3 nm for advanced {CMOS:} Issues, characterization,
                  and solutions},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {9-11},
  pages        = {1322--1329},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2007.07.048},
  doi          = {10.1016/J.MICROREL.2007.07.048},
  timestamp    = {Sat, 22 Feb 2020 19:27:35 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/GoguenheimPO07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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