BibTeX record journals/mr/GhidiniCGSSV05

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@article{DBLP:journals/mr/GhidiniCGSSV05,
  author       = {G. Ghidini and
                  C. Capolupo and
                  G. Giusto and
                  A. Sebastiani and
                  B. Stragliati and
                  Maria Elena Vitali},
  title        = {Tunnel oxide degradation under pulsed stress},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {9-11},
  pages        = {1337--1342},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.017},
  doi          = {10.1016/J.MICROREL.2005.07.017},
  timestamp    = {Tue, 16 Jan 2024 21:02:44 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/GhidiniCGSSV05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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