BibTeX record journals/mr/GawAMZZ06

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@article{DBLP:journals/mr/GawAMZZ06,
  author       = {Craig A. Gaw and
                  Thomas Arnold and
                  Robert Martin and
                  Lisa Zhang and
                  Dragan Zupac},
  title        = {Evaluation of SiGe: {C} {HBT} intrinsic reliability using conventional
                  and step stress methodologies},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {8},
  pages        = {1272--1278},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2006.02.012},
  doi          = {10.1016/J.MICROREL.2006.02.012},
  timestamp    = {Sat, 22 Feb 2020 19:26:55 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/GawAMZZ06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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