BibTeX record journals/mr/GalyS17

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@article{DBLP:journals/mr/GalyS17,
  author       = {Philippe Galy and
                  Wim Schoenmaker},
  title        = {Exploration of robustness limits and {ESD} {EMI} impact in a protection
                  device for advanced {CMOS} technology},
  journal      = {Microelectron. Reliab.},
  volume       = {76-77},
  pages        = {680--684},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.06.073},
  doi          = {10.1016/J.MICROREL.2017.06.073},
  timestamp    = {Sat, 22 Feb 2020 19:27:58 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/GalyS17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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