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BibTeX record journals/mr/FuWL07
@article{DBLP:journals/mr/FuWL07, author = {Y. Fu and Hei Wong and Juin J. Liou}, title = {Characterization and modeling of flicker noise in junction field-effect transistor with source and drain trench isolation}, journal = {Microelectron. Reliab.}, volume = {47}, number = {1}, pages = {46--50}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.01.009}, doi = {10.1016/J.MICROREL.2006.01.009}, timestamp = {Sat, 22 Feb 2020 19:28:16 +0100}, biburl = {https://dblp.org/rec/journals/mr/FuWL07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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