BibTeX record journals/mr/FalsterBV01

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@article{DBLP:journals/mr/FalsterBV01,
  author       = {R. Falster and
                  F. Bonoli and
                  V. V. Voronkov},
  title        = {Dielectric breakdown distributions for void containing silicon substrates},
  journal      = {Microelectron. Reliab.},
  volume       = {41},
  number       = {7},
  pages        = {967--971},
  year         = {2001},
  url          = {https://doi.org/10.1016/S0026-2714(01)00048-8},
  doi          = {10.1016/S0026-2714(01)00048-8},
  timestamp    = {Sat, 22 Feb 2020 19:28:35 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/FalsterBV01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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