BibTeX record journals/mr/EfthymiouRW16

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@article{DBLP:journals/mr/EfthymiouRW16,
  author       = {E. Efthymiou and
                  P. Rutter and
                  P. Whiteley},
  title        = {A methodology for projecting SiO\({}_{\mbox{2}}\) thick gate oxide
                  reliability on trench power MOSFETs and its application on MOSFETs
                  V\({}_{\mbox{GS}}\) rating},
  journal      = {Microelectron. Reliab.},
  volume       = {58},
  pages        = {26--32},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2015.11.021},
  doi          = {10.1016/J.MICROREL.2015.11.021},
  timestamp    = {Sat, 22 Feb 2020 19:27:10 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/EfthymiouRW16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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