BibTeX record journals/mr/DuvvurySBRKMC06

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@article{DBLP:journals/mr/DuvvurySBRKMC06,
  author       = {Charvaka Duvvury and
                  Robert Steinhoff and
                  Gianluca Boselli and
                  Vijay Reddy and
                  Hans Kunz and
                  Steve Marum and
                  Roger Cline},
  title        = {Gate oxide failures due to anomalous stress from {HBM} {ESD} testers},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {5-6},
  pages        = {656--665},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.120},
  doi          = {10.1016/J.MICROREL.2005.07.120},
  timestamp    = {Sat, 30 Sep 2023 10:21:32 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/DuvvurySBRKMC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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