Evaluation of RF electrostatic discharge (ESD) protection in 0.18-µm CMOS technology.

Xiaoyang Du Shurong Dong Yan Han Juin J. Liou Mingxu Huo You Li Qiang Cui Dahai Huang Demiao Wang Evaluation of RF electrostatic discharge (ESD) protection in 0.18-µm CMOS technology. 995-999 2008 48 Microelectronics Reliability 7 http://dx.doi.org/10.1016/j.microrel.2008.04.005 db/journals/mr/mr48.html#DuDHLHLCHW08