@article{DBLP:journals/mr/DuDHLHLCHW08,
author = {Xiaoyang Du and
Shurong Dong and
Yan Han and
Juin J. Liou and
Mingxu Huo and
You Li and
Qiang Cui and
Dahai Huang and
Demiao Wang},
title = {Evaluation of RF electrostatic discharge (ESD) protection
in 0.18-\^{\i}\^{\i}\^{\i}\^{\i}\^{\i}\^{\i}\^{\i}\^{\i}\^{\i}\^{\i}\^{\i}\^{\i}\^{\i}\^{\i}\^{\i}\^{\i}\^{\i}\^{\i}\^{\i}\^{\i}},
journal = {Microelectronics Reliability},
volume = {48},
number = {7},
year = {2008},
pages = {995-999},
ee = {http://dx.doi.org/10.1016/j.microrel.2008.04.005},
bibsource = {DBLP, http://dblp.uni-trier.de}
}