BibTeX record journals/mr/DongZLSB10

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@article{DBLP:journals/mr/DongZLSB10,
  author       = {X. Dong and
                  P. Zhu and
                  Zhonghua Li and
                  Jun Sun and
                  J. D. Boyd},
  title        = {Electromigration-induced stress in a confined bamboo interconnect
                  with randomly distributed grain sizes},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {3},
  pages        = {391--397},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2010.01.002},
  doi          = {10.1016/J.MICROREL.2010.01.002},
  timestamp    = {Tue, 06 Oct 2020 08:58:19 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/DongZLSB10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}