BibTeX record journals/mr/Djezzar02

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@article{DBLP:journals/mr/Djezzar02,
  author       = {Boualem Djezzar},
  title        = {On the correlation between radiation-induced oxide- and border-trap
                  effects in the gate-oxide nMOSFET's},
  journal      = {Microelectron. Reliab.},
  volume       = {42},
  number       = {12},
  pages        = {1865--1874},
  year         = {2002},
  url          = {https://doi.org/10.1016/S0026-2714(02)00242-1},
  doi          = {10.1016/S0026-2714(02)00242-1},
  timestamp    = {Sat, 22 Feb 2020 19:28:56 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Djezzar02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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