BibTeX record journals/mr/DinaraGHBBB15

• > Home > journals/mr/DinaraGHBBB15

@article{DBLP:journals/mr/DinaraGHBBB15,
  author       = {Syed Mukulika Dinara and
                  Saptarsi Ghosh and
                  Nripendra N. Halder and
                  Ankush Bag and
                  Sekhar Bhattacharya and
                  Dhrubes Biswas},
  title        = {Potentiality of trap charge effects and SiON induced interface defects
                  in a-Si\({}_{\mbox{3}}\)N\({}_{\mbox{4}}\)/SiON based {MIS} structure
                  for resistive {NVM} device},
  journal      = {Microelectron. Reliab.},
  volume       = {55},
  number       = {5},
  pages        = {789--794},
  year         = {2015},
  url          = {https://doi.org/10.1016/j.microrel.2015.02.013},
  doi          = {10.1016/J.MICROREL.2015.02.013},
  timestamp    = {Sat, 22 Feb 2020 19:27:49 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/DinaraGHBBB15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}