BibTeX record journals/mr/DieudonneDJRB01

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@article{DBLP:journals/mr/DieudonneDJRB01,
  author       = {Fran{\c{c}}ois Dieudonn{\'{e}} and
                  F. Daug{\'{e}} and
                  Jalal Jomaah and
                  C. Raynaud and
                  Francis Balestra},
  title        = {An overview of hot-carrier induced degradation in 0.25 mum Partially
                  and Fully Depleted {SOI} N-MOSFET's},
  journal      = {Microelectron. Reliab.},
  volume       = {41},
  number       = {9-10},
  pages        = {1417--1420},
  year         = {2001},
  url          = {https://doi.org/10.1016/S0026-2714(01)00165-2},
  doi          = {10.1016/S0026-2714(01)00165-2},
  timestamp    = {Sat, 22 Feb 2020 19:27:27 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/DieudonneDJRB01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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