Gunnar Diestel Andreas Martin Martin Kerber Alfred Schlemm Horst Erlenmaier Bernhard Murr Andreas Preussger Quality assessment of thin oxides using constant and ramped stress measurements. 1019-1022 2001 41 Microelectronics Reliability 7 http://dx.doi.org/10.1016/S0026-2714(01)00061-0 db/journals/mr/mr41.html#DiestelMKSEMP01