DBLP BibTeX Record 'journals/mr/DelageD03'

@article{DBLP:journals/mr/DelageD03,
  author    = {Sylvain L. Delage and
               Christian Dua},
  title     = {Wide band gap semiconductor reliability : Status and trends},
  journal   = {Microelectronics Reliability},
  volume    = {43},
  number    = {9-11},
  year      = {2003},
  pages     = {1705-1712},
  ee        = {http://dx.doi.org/10.1016/S0026-2714(03)00338-X},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}