BibTeX record: journals/mr/DelageD03

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@article{DBLP:journals/mr/DelageD03,
  author    = {Sylvain L. Delage and
               Christian Dua},
  title     = {Wide band gap semiconductor reliability : Status and trends.},
  journal   = {Microelectronics Reliability},
  year      = {2003},
  volume    = {43},
  number    = {9-11},
  pages     = {1705--1712},
  url       = {http://dx.doi.org/10.1016/S0026-2714(03)00338-X},
  doi       = {10.1016/S0026-2714(03)00338-X},
  timestamp = {Wed, 03 Sep 2014 09:09:33 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/journals/mr/DelageD03},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}