BibTeX record journals/mr/DammannBBKKGSQ18

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@article{DBLP:journals/mr/DammannBBKKGSQ18,
  author       = {Maximilian Dammann and
                  Martina Baeumler and
                  Peter Br{\"{u}}ckner and
                  Tobias Kemmer and
                  Helmer Konstanzer and
                  Andreas Graff and
                  Mich{\'{e}}l Simon{-}Najasek and
                  R{\"{u}}diger Quay},
  title        = {Comparison of reliability of 100{\unicode{8239}}nm AlGaN/GaN HEMTs
                  with T-gate and SAG-gate technology},
  journal      = {Microelectron. Reliab.},
  volume       = {88-90},
  pages        = {385--388},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.06.042},
  doi          = {10.1016/J.MICROREL.2018.06.042},
  timestamp    = {Thu, 14 Oct 2021 09:38:37 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/DammannBBKKGSQ18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}