BibTeX record journals/mr/DaiLZZHBZZ17

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@article{DBLP:journals/mr/DaiLZZHBZZ17,
  author       = {Lihua Dai and
                  Xiaonian Liu and
                  Mengying Zhang and
                  Leqing Zhang and
                  Zhiyuan Hu and
                  Dawei Bi and
                  Zhengxuan Zhang and
                  Shichang Zou},
  title        = {Degradation induced by {TID} radiation and hot-carrier stress in 130-nm
                  short channel {PDSOI} NMOSFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {74},
  pages        = {74--80},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.05.021},
  doi          = {10.1016/J.MICROREL.2017.05.021},
  timestamp    = {Sat, 22 Feb 2020 19:26:57 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/DaiLZZHBZZ17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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