BibTeX record journals/mr/CretuBGG02

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@article{DBLP:journals/mr/CretuBGG02,
  author       = {B. Cretu and
                  Francis Balestra and
                  G{\'{e}}rard Ghibaudo and
                  G. Gu{\'{e}}gan},
  title        = {Origin of hot carrier degradation in advanced nMOSFET devices},
  journal      = {Microelectron. Reliab.},
  volume       = {42},
  number       = {9-11},
  pages        = {1405--1408},
  year         = {2002},
  url          = {https://doi.org/10.1016/S0026-2714(02)00159-2},
  doi          = {10.1016/S0026-2714(02)00159-2},
  timestamp    = {Sat, 30 Sep 2023 10:21:32 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/CretuBGG02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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