@article{DBLP:journals/mr/CrepelBMHCGPDL02,
author = {O. Cr{\'e}pel and
Felix Beaudoin and
L. Dantas de Morais and
G. Haller and
C. Goupil and
Philippe Perdu and
Romain Desplats and
Dean Lewis},
title = {Backside Hot Spot Detection Using Liquid Crystal Microscopy},
journal = {Microelectronics Reliability},
volume = {42},
number = {9-11},
year = {2002},
pages = {1741-1746},
ee = {http://dx.doi.org/10.1016/S0026-2714(02)00223-8},
bibsource = {DBLP, http://dblp.uni-trier.de}
}