Hsien-Chin Chiu Chih-Wei Yang Chao-Hung Chen Che-Kai Lin Jeffrey S. Fu Hsing-Yuan Tu Shiang-Feng Tang High thermal stability AlGaAs/InGaAs enhancement-mode pHEMT using palladium-gate technology. 847-850 2010 50 Microelectronics Reliability 6 http://dx.doi.org/10.1016/j.microrel.2010.02.022 db/journals/mr/mr50.html#ChiuYCLFTT10