BibTeX record journals/mr/ChithambaramTZL18

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@article{DBLP:journals/mr/ChithambaramTZL18,
  author       = {Shaalini Chithambaram and
                  Pik Kee Tan and
                  Yuzhe Zhao and
                  Binghai Liu and
                  Yinzhe Ma and
                  Alfred Quah and
                  Dayanand Nagalingam and
                  Yanlin Pan and
                  Zhihong Mai},
  title        = {Failure analysis on 14{\unicode{8239}}nm FinFET devices with {ESD}
                  {CDM} failure},
  journal      = {Microelectron. Reliab.},
  volume       = {88-90},
  pages        = {321--333},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.06.105},
  doi          = {10.1016/J.MICROREL.2018.06.105},
  timestamp    = {Sat, 22 Feb 2020 19:29:19 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ChithambaramTZL18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}