BibTeX record journals/mr/ChiquetMLMPLBO12

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@article{DBLP:journals/mr/ChiquetMLMPLBO12,
  author       = {Philippe Chiquet and
                  Pascal Masson and
                  Romain Laffont and
                  Gilles Micolau and
                  J{\'{e}}r{\'{e}}my Postel{-}Pellerin and
                  Fr{\'{e}}d{\'{e}}ric Lalande and
                  Bernard Bouteille and
                  Jean{-}Luc Ogier},
  title        = {Investigation of the effects of constant voltage stress on thin SiO\({}_{\mbox{2}}\)
                  layers using dynamic measurement protocols},
  journal      = {Microelectron. Reliab.},
  volume       = {52},
  number       = {9-10},
  pages        = {1895--1900},
  year         = {2012},
  url          = {https://doi.org/10.1016/j.microrel.2012.06.124},
  doi          = {10.1016/J.MICROREL.2012.06.124},
  timestamp    = {Sat, 22 Feb 2020 19:29:28 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ChiquetMLMPLBO12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}