BibTeX record journals/mr/Cheung01a

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@article{DBLP:journals/mr/Cheung01a,
  author       = {Kin P. Cheung},
  title        = {Impact of {ESD} protection device trigger transient on the reliability
                  of ultra-thin gate oxide},
  journal      = {Microelectron. Reliab.},
  volume       = {41},
  number       = {5},
  pages        = {745--749},
  year         = {2001},
  url          = {https://doi.org/10.1016/S0026-2714(01)00011-7},
  doi          = {10.1016/S0026-2714(01)00011-7},
  timestamp    = {Sat, 22 Feb 2020 19:28:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Cheung01a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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