@article{DBLP:journals/mr/ChenXXAKCXST05,
author = {Jian Chen and
Jianbin Xu and
K. Xue and
J. An and
Ning Ke and
W. Cao and
H. B. Xia and
J. Shi and
D. C. Tian},
title = {Nanoscale structural characteristics and electron field
emission properties of transition metal-fullerene compound
TiC$_{\mbox{60}}$ films},
journal = {Microelectronics Reliability},
volume = {45},
number = {1},
year = {2005},
pages = {137-142},
ee = {http://dx.doi.org/10.1016/j.microrel.2004.05.006},
bibsource = {DBLP, http://dblp.uni-trier.de}
}