BibTeX record journals/mr/ChatterjeeKLTM06

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@article{DBLP:journals/mr/ChatterjeeKLTM06,
  author       = {S. Chatterjee and
                  Yue Kuo and
                  J. Lu and
                  J.{-}Y. Tewg and
                  P. Majhi},
  title        = {Electrical reliability aspects of HfO\({}_{\mbox{2}}\) high-k gate
                  dielectrics with TaN metal gate electrodes under constant voltage
                  stress},
  journal      = {Microelectron. Reliab.},
  volume       = {46},
  number       = {1},
  pages        = {69--76},
  year         = {2006},
  url          = {https://doi.org/10.1016/j.microrel.2005.02.004},
  doi          = {10.1016/J.MICROREL.2005.02.004},
  timestamp    = {Sat, 22 Feb 2020 19:28:18 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ChatterjeeKLTM06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}