DBLP BibTeX Record 'journals/mr/CericS02'

@article{DBLP:journals/mr/CericS02,
  author    = {Hajdin Ceric and
               Siegfried Selberherr},
  title     = {Simulative prediction of the resistance change due to electromigration
               induced void evolution},
  journal   = {Microelectronics Reliability},
  volume    = {42},
  number    = {9-11},
  year      = {2002},
  pages     = {1457-1460},
  ee        = {http://dx.doi.org/10.1016/S0026-2714(02)00169-5},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}