BibTeX record: journals/mr/CericS02

download as .bib file

@article{DBLP:journals/mr/CericS02,
  author    = {Hajdin Ceric and
               Siegfried Selberherr},
  title     = {Simulative prediction of the resistance change due to electromigration
               induced void evolution},
  journal   = {Microelectronics Reliability},
  year      = {2002},
  volume    = {42},
  number    = {9-11},
  pages     = {1457--1460},
  url       = {http://dx.doi.org/10.1016/S0026-2714(02)00169-5},
  doi       = {10.1016/S0026-2714(02)00169-5},
  timestamp = {Tue, 23 Sep 2014 12:37:56 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/journals/mr/CericS02},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}