BibTeX record journals/mr/CaoSLA03

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@article{DBLP:journals/mr/CaoSLA03,
  author       = {X. A. Cao and
                  P. M. Sandvik and
                  S. F. LeBoeuf and
                  S. D. Arthur},
  title        = {Defect generation in InGaN/GaN light-emitting diodes under forward
                  and reverse electrical stresses},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {12},
  pages        = {1987--1991},
  year         = {2003},
  url          = {https://doi.org/10.1016/j.microrel.2003.06.001},
  doi          = {10.1016/J.MICROREL.2003.06.001},
  timestamp    = {Sat, 22 Feb 2020 19:26:53 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/CaoSLA03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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