BibTeX record journals/mr/CaiYZHLXZZC16

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@article{DBLP:journals/mr/CaiYZHLXZZC16,
  author       = {Miao Cai and
                  Dao{-}Guo Yang and
                  Jianna Zheng and
                  Jianlin Huang and
                  Dongjing Liu and
                  Jing Xiao and
                  Ping Zhang and
                  Guoqi Zhang and
                  Xianping Chen},
  title        = {Effects of stress-loading test methods on the degradation of light-emitting
                  diode modules},
  journal      = {Microelectron. Reliab.},
  volume       = {64},
  pages        = {635--639},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.07.009},
  doi          = {10.1016/J.MICROREL.2016.07.009},
  timestamp    = {Sat, 22 Feb 2020 19:28:39 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/CaiYZHLXZZC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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