BibTeX record journals/mr/BukhoriRA08

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@article{DBLP:journals/mr/BukhoriRA08,
  author       = {Muhammad Faiz Bukhori and
                  Scott Roy and
                  Asen Asenov},
  title        = {Statistical aspects of reliability in bulk MOSFETs with multiple defect
                  states and random discrete dopants},
  journal      = {Microelectron. Reliab.},
  volume       = {48},
  number       = {8-9},
  pages        = {1549--1552},
  year         = {2008},
  url          = {https://doi.org/10.1016/j.microrel.2008.06.029},
  doi          = {10.1016/J.MICROREL.2008.06.029},
  timestamp    = {Sat, 22 Feb 2020 19:27:06 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BukhoriRA08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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