BibTeX record journals/mr/BravaixTGRV03

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@article{DBLP:journals/mr/BravaixTGRV03,
  author       = {Alain Bravaix and
                  C. Trapes and
                  Didier Goguenheim and
                  Nathalie Revil and
                  E. Vincent},
  title        = {Carrier injection efficiency for the reliability study of 3.5-1.2
                  nm thick gate-oxide {CMOS} technologies},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {8},
  pages        = {1241--1246},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00178-1},
  doi          = {10.1016/S0026-2714(03)00178-1},
  timestamp    = {Sat, 30 Sep 2023 10:21:32 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/BravaixTGRV03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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