![](https://dblp.uni-trier.de/img/logo.ua.320x120.png)
![](https://dblp.uni-trier.de/img/dropdown.dark.16x16.png)
![](https://dblp.uni-trier.de/img/peace.dark.16x16.png)
Остановите войну!
for scientists:
![search dblp search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
![search dblp](https://dblp.uni-trier.de/img/search.dark.16x16.png)
default search action
BibTeX record journals/mr/BravaixTGRV03
@article{DBLP:journals/mr/BravaixTGRV03, author = {Alain Bravaix and C. Trapes and Didier Goguenheim and Nathalie Revil and E. Vincent}, title = {Carrier injection efficiency for the reliability study of 3.5-1.2 nm thick gate-oxide {CMOS} technologies}, journal = {Microelectron. Reliab.}, volume = {43}, number = {8}, pages = {1241--1246}, year = {2003}, url = {https://doi.org/10.1016/S0026-2714(03)00178-1}, doi = {10.1016/S0026-2714(03)00178-1}, timestamp = {Sat, 30 Sep 2023 10:21:32 +0200}, biburl = {https://dblp.org/rec/journals/mr/BravaixTGRV03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
![](https://dblp.uni-trier.de/img/cog.dark.24x24.png)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.