BibTeX record journals/mr/BravaixGDHPPRV05

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@article{DBLP:journals/mr/BravaixGDHPPRV05,
  author       = {Alain Bravaix and
                  Didier Goguenheim and
                  M. Denais and
                  Vincent Huard and
                  C. R. Parthasarathy and
                  F. Perrier and
                  Nathalie Revil and
                  E. Vincent},
  title        = {Impacts of the recovery phenomena on the worst-case of damage in {DC/AC}
                  stressed ultra-thin {NO} gate-oxide MOSFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {45},
  number       = {9-11},
  pages        = {1370--1375},
  year         = {2005},
  url          = {https://doi.org/10.1016/j.microrel.2005.07.023},
  doi          = {10.1016/J.MICROREL.2005.07.023},
  timestamp    = {Sat, 30 Sep 2023 10:21:32 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/BravaixGDHPPRV05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}