BibTeX record journals/mr/Bouarroudj-BerkaniOLMKS10

download as .bib file

@article{DBLP:journals/mr/Bouarroudj-BerkaniOLMKS10,
  author       = {M. Bouarroudj{-}Berkani and
                  D. Othman and
                  St{\'{e}}phane Lefebvre and
                  S. Moumen and
                  Zoubir Khatir and
                  T. Ben Sallah},
  title        = {Ageing of SiC {JFET} transistors under repetitive current limitation
                  conditions},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {9-11},
  pages        = {1532--1537},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2010.07.035},
  doi          = {10.1016/J.MICROREL.2010.07.035},
  timestamp    = {Sat, 22 Feb 2020 19:28:12 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Bouarroudj-BerkaniOLMKS10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.