BibTeX record journals/mr/BeylierBBG08

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@article{DBLP:journals/mr/BeylierBBG08,
  author       = {Gaelle Beylier and
                  Sylvie Bruy{\`{e}}re and
                  Darcy Benoit and
                  G{\'{e}}rard Ghibaudo},
  title        = {Impact of silicon nitride {CESL} on {NLDEMOS} transistor reliability},
  journal      = {Microelectron. Reliab.},
  volume       = {48},
  number       = {8-9},
  pages        = {1539--1543},
  year         = {2008},
  url          = {https://doi.org/10.1016/j.microrel.2008.07.035},
  doi          = {10.1016/J.MICROREL.2008.07.035},
  timestamp    = {Thu, 29 Oct 2020 10:44:36 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BeylierBBG08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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